|
Non-Contact Temperature
Measurements of Active Devices
- Measure the channel temperature of various electronic
devices rangind from simple transistors to HFET and
pHEMT MMICs,
while characterizing their scalar electrical performance (i.e. gain and
output power).
- Probing spot
diameter smaller than 0.8 mm
- Less than ±
2°C uncertainty over a 200°C temperature range
- Automated probing
of a sample’s surface along a prescribed trajectory
- Five (5) MHz
tracking capability of temperature variations
|
