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Simultaneously
measures the thermoconductivity of thin films
and the thermal interface
resistance between them
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Able to measure
thickness of opaque materials (thin film metals
or semiconductor layers)
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Single
measurement based on hundreds of laser shots takes
less than a minute and has
remarkable accuracy
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Lasers
power delivered via fiber cables
Adavantages
over old TTR system
- Portable
system
- Laser
light is delivered via fiber optics
- Cost
efficient system
- Two
orders of magnitude faster than the previous
system
- Labview
developed user-friendly interface
Pictures
of the Transometer
Click
on the picture for a larger image
Please contact us for specifications of
the transometer
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