






Prof. Ping Gui
Ping Gui, Ph.D.
Associate Professor
Department of Electrical Engineering
School of Engineering
Southern Methodist University
P.O. Box 750338, Dallas, TX
752750338 (Mail)
6251 Airline Rd. #308, Dallas, TX
75205 (Courier)
Email: pgui@lyle.smu.edu
Voice: (214) 7681733
Fax:(214) 7683573
Office: Jerry Junkins #319







RESEARCH INTERESTS
Analog, mixedsignal, RF/mmwave, and digital Integrated Circuits (IC) design for a variety of applications including highspeed wireless and wireline communications using mmwave, lowpower biomedical circuits, mmwave automotive RADARs, highspeed ADC/DACs, circuits and systems for extreme and harsh environments, and hardware security.







LATEST PUBLICATIONS
2015

S. Guo, T. Liu, T. Zhang, T. Xi, G. Wu, P. Gui, W. Maung, Y. Fan, and M. Morgan, " A LowVoltage LowPower 25 Gb/s SerialLink Receiver," to appear in Proceedings of IEEE RadioFrequency Integrated Circuits (RFIC) 2015.
T. Xi, S. Huang, S. Guo, P. Gui, J. Zhang, K. K. O, D. Huang, and Y. Fan, " New HighEfficiency 88 GHz Power Amplifier in 65nm CMOS Process," to appear in IEEE International Microwave Symposium (IMS) 2015.
S. Guo, T. Xi, P. Gui, D. Huang, Y. Fan, M. Morgan, “A Transformer Feedback Gmboosting Technique for Gain Improvement and Noise Reduction in mmWave Cascode LNAs,” submitted to IEEE Transactions on Microwave Theory and Techniques (MTT).
T. Xi, S. Guo, P. Gui, D. Huang, Y. Fan, M. Morgan, “LowPhaseNoise 54GHz Quadrature VCO and 76GHz/90GHz VCOs in 65nm CMOS process,” submitted to IEEE Transactions on Microwave Theory and Techniques (MTT).
R. Wang, D. Huang, T. He, Y. You, P. Gui, J. Chen, “A Effect of OPAMP Input Offset on ContinuousTime ΔΣ Modulators with CurrentMode DACs,” IEEE Transactions on Circuits and Systems I(TCASI), in press.
G. Wu, D. Huang, J. Li, P. Gui, T. Liu, S. Guo, Y. Fan, M. Morgan, " A 116 Gb/s AllDigital Clock and Data Recovery with a Wideband, HighLinearity Phase Interpolator," IEEE Transactions on VLSI, in press.
R.Wang, Y.You, G. Wu, X. Wen, J. Chen, K. Azadet, P.Gui, “A 150 MHz Bandwidth ContinuousTime ΔΣ Modulator in 28 nm CMOS with DAC Calibration,” to appear in IEEE MidWest Circuits and Systems Symposium (MWCAS) 2015 .
Q. Khasawneh, J. Dworak, P. Gui, “An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex MixedSignal Devices,” to appear in IEEE North Atlantic Test Workshop 2015.
S. Huang, T. Xi, D. Huang, P.Gui, R. Taori, “A LowPower and HighLinearity CMOS Parametric Passive Mixers for Millimeter Wave Applications,” Proceedings of IEEE Texas Symposium on Wireless and Microwave Circuits and Systems 2015.
K. Nepal, S. Alhelaly, J. Dworak, R. Iris Bahar, T. Manikas, and P. Gui, " Repairing a 3D DieStack Using Available Programmable Logic," IEEE Transactions on ComputerAided Design of Integrated Circuits and Systems, in press.
K. Sun, Z. Gao, P. Gui, R. Wang, I. Oguzman, X. Xu, K. Vasanth, Q. Zhou, K. Shung, " A High SlewRate HighVoltage Linear Amplifier for Ultrasonic Imaging Applications in a HighVoltage SOI Technology," IEEE Transactions on Circuits and Systems(TCAS) II, in press.
T. Zhang, F. Tavernier, P. Moreira, and P. Gui, " A 10 Gb/s Laser Driver in 130 nm CMOS Technology for Highenergy Physics Applications," Journal of Instruments, JINST_10_C02036, 2015.
W. Xia, T. Zhang, P. Gui, T. Liu and J. Hoff, " Thermal Analysis of the protoVIPRAM2D chip," Journal of Instruments, JINST_10_C02036, 2015.

2014

S. Guo, T. Xi, P. Gui, J. Zhang, W. Choi, K. K. O, Y. Fan, D. Huang, R. Gu, and M. Morgan, " 54 GHz CMOS LNAs with 3.6 dB NF and 28.2 dB Gain Using Transformer Feedback GmBoosting Technique," Proceedings of IEEE Asian SolidState Circuits Conference (ASSCC) 2014.
T. Xi, S. Guo, P. Gui, J. Zhang, K. K. O, Y. Fan, D. Huang, R. Gu, M. Morgan, " LowPhaseNoise 54GHz Quadrature VCO and 76GHz/90GHz VCOs in 65nm CMOS process" Proceedings of IEEE RadioFrequency Integrated Circuits (RFIC) 2014.
Z. Gao, P. Gui, X. Xu, R. Jordanger, I. Oguzman, R. Hamilton, and K. Vasanth, " An Integrated HighVoltage LowDistortion CurrentFeedback Linear Power Amplifier for Ultrasound Transmitters Using Digital Predistortion and Dynamic Current Biasing Techniques," IEEE Transactions on Circuits and Systems II. Vol. 61, Iss. 6, pp. 373377, June 2014.
J. Dworak, K. Nepal, T. W. Manikas, P. Gui, P. and R. I. Bahar, " Repurposing Programmable Logic in 3D Die Stacks for test and repair," Proceedings of IEEE International Test Conference (ITC), 2014.
S. Guo, T. Liu, T. Zhang, G. Wu,T. Xi, P. Gui, W. Maung, M. Morgan, " A LowPower 28 Gb/s ClockDataRecovery (CDR)," Proceedings of SRC TECHCON 2014.
G. Wu, J. Li, D. Huang, P.Gui, T. Liu, S. Guo, S. Chakraborty, Y. Fan, and M. Morgan, " A 116 Gbps All Digital Clock and Data Recovery with a Wideband, HighLinearity Phase Interpolator," Proceedings of SRC TECHCON 2014.
S. Guo, T. Xi, G. Wu, T. Liu, T. Zhang, P. Gui, Y. Fan and M. Morgan, " A LowPower 28 Gb/S CDR Using Artificial LC Transmission Line Technique in 65 nm CMOS," Proceedings of IEEE MWSCAS 2014.
T. Xi, S. Guo, P. Gui, J. Zhang, K. K. O, Y. Fan, D. Huang, R. Gu, M. Morgan, " LowPhaseNoise 54GHz Quadrature VCO and 76GHz/90GHz VCOs in 65nm CMOS process," Proceedings of SRC TECHCON 2014.
T. Zhang, F. Tavernier, P. Moreira, and P. Gui," A 10 Gb/s Laser Driver in 130 nm CMOS Technology for Highenergy Physics Applications, "Proceedings of Topical Workshop on Electronics for Particle Physics (TWEPP) 2014.
W. Xia, T. Zhang, P. Gui, T. Liu and J. Hoff," Thermal Analysis of the protoVIPRAM2D chip, " Proceedings of Topical Workshop on Electronics for Particle Physics (TWEPP) 2014.
J. Beshay, Y. Du, P. Huang, N. Mahabaleshwar, B. McMillin, E. Nourbakhsh, K. Subramani, T. Xi, B. Banerjee, J. Camp, J. Chen, P. Gui, R. Prakash, and D. Rajan," Wireless Networking Testbed and Emulator (WiNeTestEr), " Proceedings of ACM MSWiM, Montreal, Canada, September 2014.
G. Wu, K. Sun, T.Zhang, S. Guo, T. Xi, R. Wang, and P. Gui," A lowvoltage temperature compensated VCO design, " IEEE DCAS Workshop 2014.
G. Wu, G. W. Deptuch, J. Hoff, and P. Gui," Degradations of threshold voltage, mobility and drain current and the dependence on transistor geometry for stressing at 77 K and 300 K, " IEEE Transactions on Device and Materials Reliability, Vol. 14, Iss. 1, pp. 477483, March 2014.




