Q. KHASAWNEH, J. DWORAK, P.GUI, B. WILLIAMS, A.ELLIOTT, and A. MUTHAIAH, "Simple Real-Time Monitoring of Test Fallout Data to Quickly Identify Tester and Yield Issues in a Multi-Site Environment”, Accepted for presentation at IEEE VLSI Test Symposium 2018.

Q. Khasawneh, J. Dworak, P. Gui, “An Industrial Case Study: PaRent (Parallel & Concurrent) Testing for Complex Mixed-Signal Devices,” Proceedings of IEEE North Atlantic Test Workshop 2015.